[1]WU Yiquan,WAN Hong,YE Zhilong.Fabric defect image noise reduction based on complex contourlet transform and anisotropic diffusion[J].CAAI Transactions on Intelligent Systems,2013,8(3):214-219.
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CAAI Transactions on Intelligent Systems[ISSN 1673-4785/CN 23-1538/TP] Volume:
8
Number of periods:
2013 3
Page number:
214-219
Column:
学术论文—机器学习
Public date:
2013-06-25
- Title:
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Fabric defect image noise reduction based on complex contourlet transform and anisotropic diffusion
- Author(s):
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WU Yiquan1; 2; 3; WAN Hong1; YE Zhilong1
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1. College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China;
2. Key Laboratory of Textile Science & Technology, Ministry of Education, Donghua University, Shanghai 201620, China;
3. Key Laboratory of Advanced Textile Materials and Manufacturing Technology, Ministry of Education, Zhejiang Sci-Tech University, Hangzhou 310018, China
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- Keywords:
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fabric defect detection; fabric defect image; image noise reduction; complex contourlet transform; anisotropic diffusion; P_Laplace operator; Catte_PM model
- CLC:
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TP391.4;TS103.7
- DOI:
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- Abstract:
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